portable sf6 n2 mixtures in tunisia

Prebreakdown Corona Process in SF6 and SF6/N2 Mixtures

Prebreakdown Corona Process in SF6 and SF6/N2 MixturesFARISH,O《Int.sympo.high Voltage Engineering》O. Farish , O. E. Ibrahim and A. Kurimoto 

influence on multiphoton absorption in SF6–N2 mixtures

Buffer-gas pressure influence on multiphoton absorption in SF6–N2 mixturesMultiphoton absorptionPhotoacoustic spectroscopyVibrational energy transfer

of SF_{6}^{-} in SF6-Ne, SF6-N2 and SF6-O2 mixtures

Transport properties of SF_{6}^{-} in SF6-Ne, SF6-N2 and SF6-O2 mixturesThe mobility of SF_{6}^{-} has been calculated for the gas mixtures

Calculation of inception voltages in SF6-N2 mixtures

Calculation of inception voltages in SF6-N2 mixturesDielectric Materials, Measurements and Applications, 1992., Sixth International Conference on

in portable equipment for recovering SF6 in SF6N2 mixtures

Impulse breakdown of a point-plane gap in SF6 and SF6/N2 mixtures.A dual photomultiplier system and a field probe has been used to study the opto

SF6 N2 Mixtures for Application in EHV Gas Insulated Systems

SF6 N2 Mixtures for Application in EHV Gas Insulated SysteBSTRACT: SF6 gas insulated equipment forms a major component of growing electrical power networks

BREAKDOWN IN SF6, SF6/N2 AND SF6/N2/PERFLUOROCARBON MIXTURES

Abstract The impulse breakdown strengths of binary mixtures of SF6/N2, SF6/PFC (perfluorocarbon), PFC/N2, and ternary mixtures of SF6/PFC/N2 have

discharges in SF6, Co2, N2, and SF6-CO2 and SF6-N2 mixtures

(solid/gas or mixture) and a point-plane electrode arrangement consists of(a) Glass in SF6; (b) Glass in CO2; and (c) epoxy resin in N2

on multiphoton absorption efficiency in SF6-N2 mixtures

The results of pulsed IR photoacoustic spectroscopy measurements of multiphoton absorption and rotational relaxation processes in SF6-N2 mixtures are present

Transport coefficients in arc plasma of SF6–N2 mixtures

A.Gleizes, M.Razafinimanana and S.Vacquie: Transport co efficients in arc plasma of SF6-N2 mixtures, J.Appl.Phys., 54, 3777-3787(1983)